Semiconductor RF burn-in device for testing
We propose a system configuration tailored to CH numbers, FET packages, and testing conditions!
The "Semiconductor RF Burn-In Device for Testing" is a power testing device for high-frequency devices (hereafter referred to as FETs). Depending on the application, you can choose between a hot plate (heater) type and a constant temperature bath type. It is equipped with a safety circuit that safely stops the device without damaging the customer's FET. It is compatible with various lineups from major semiconductor manufacturers and can flexibly accommodate special FETs through in-house development. 【Features】 ■ Diverse device configurations ■ Strong against oscillation ■ Capable of stable operation ■ Can conduct burn-in tests at high temperatures ■ Proposes system construction tailored to the number of channels, FET packages, and testing conditions *For more details, please refer to the product information or feel free to contact us.
- Company：多摩川電子
- Price：Other
